Optimum time-censored simple ramp-stress accelerated life test sampling plan for the log-logistic distribution

Pencarian berdasarkan :

SEMUA Pengarang Subjek ISBN/ISSN Pencarian Spesifik

Pencarian terakhir:

Image of Optimum time-censored simple ramp-stress accelerated life test sampling plan for the log-logistic distribution

Article

Optimum time-censored simple ramp-stress accelerated life test sampling plan for the log-logistic distribution

Preeti Wanti Srivastava - Nama Orang; Deepmala Sharma - Nama Orang;

Acceptance sampling plans are designed to decide about acceptance or rejection of a lot of products on the basis of sample drawn from it. Accelerating the life test helps in obtaining information about the lifetimes of high reliability products quickly. The purpose of this paper is to formulate an optimum time censored acceptance sampling plan based on ramp-stress accelerated life test (ALT) for items having log-logistic life distribution. The log-logistic life distribution has been found appropriate for highly reliable components such as power system components and insulating materials.

Ketersediaan

IPC Corporate University Library ATC LO SHA o C.1

ATC1602307

Tersedia

Informasi Detail

Judul Seri: Journal of Quality in Maintenance Engineering
No. Panggil: ATC LO SHA o
Penerbit: India : Emerald Insight., 2015
Deskripsi Fisik: 23 p.
Bahasa: English
ISBN/ISSN: -
Klasifikasi: LO
Tipe Isi: -
Tipe Media: -
Tipe Pembawa: online resource
Edisi: Vol. 21 No. 1, 2015 pp. 112-132
Subjek: Accelerated life test
Consumer’s risk
Cumulative exposure model
Producer’s risk
Info Detail Spesifik: -
Pernyataan Tanggungjawab: Deepmala Sharma

Versi lain/terkait

Tidak tersedia versi lain

Lampiran Berkas

Harap masuk untuk melihat lampiran

Komentar

Anda harus masuk sebelum memberikan komentar